For high-performance, high-speed testing of RF and microwave devices, Aeroflex introduces the SMART^E™ 5300 general-purpose test environment. The DC to 40 GHz SMART^E™ 5300 is unique in its ability to test, monitor, and control any Device Under Test (DUT) within a single test environment.
\n“SMART^E™ 5300 eliminates a large rack of test equipment and replaces it with a compact test system that is quickly reconfigured and redeployed to suit any individual DUT or production line,” said Dr. Francesco Lupinetti, senior business development executive for Aeroflex’s High Speed Test Solutions. “The SMART^E™ 5300 also has the ability to emulate legacy and obsolete instruments. In this market, long-term support is a major concern. The fact that we can offer customers a ‘future-proof’ system gives customers peace of mind.”
\nSMART^E™ 5300 is designed for parametric and functional testing in the military\/aerospace and high-performance commercial markets. The system is ideal for customers with one or more of these demanding RF\/microwave test requirements: High throughput production; Large number of unique tests per DUT; Highly repetitive tests per DUT; Product lines requiring rapid software reconfiguration of test systems; Replacement of racks of older or obsolete equipment with a “synthetic” or software-defined test environment.
\nSMART^E™ 5300 test environment is the ultimate in flexible testing
\nThe SMART^E™ 5300 is the highest performance, lowest life cycle cost, turnkey synthetic test environment for general purpose RF\/microwave parametric and functional testing. Its many features reduce complexity and result in extending the life cycle of test environments.
\nAll hardware modules and interfaces are based on widely used industry standards including PXI, LXI, cPCI, Ethernet, etc. Standard software interfaces are exercised through a full-featured Test Executive and National Instruments’ TestStand™ engine.<\/p>\n","protected":false},"excerpt":{"rendered":"
For high-performance, high-speed testing of RF and microwave devices, Aeroflex introduces the SMART^E™ 5300 general-purpose test environment. The DC to 40 GHz SMART^E™ 5300 is unique in its ability to test, monitor, and control any Device Under Test (DUT) within a single test environment. “SMART^E™ 5300 eliminates a large rack of test equipment and replaces […]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[7],"tags":[],"class_list":["post-305333","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/mereja.media\/index\/wp-json\/wp\/v2\/posts\/305333","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/mereja.media\/index\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/mereja.media\/index\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/mereja.media\/index\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/mereja.media\/index\/wp-json\/wp\/v2\/comments?post=305333"}],"version-history":[{"count":0,"href":"https:\/\/mereja.media\/index\/wp-json\/wp\/v2\/posts\/305333\/revisions"}],"wp:attachment":[{"href":"https:\/\/mereja.media\/index\/wp-json\/wp\/v2\/media?parent=305333"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/mereja.media\/index\/wp-json\/wp\/v2\/categories?post=305333"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/mereja.media\/index\/wp-json\/wp\/v2\/tags?post=305333"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}