The newest generation of the proven FISCHER XDL® spectrometers is now available. They replace the well established FISCHERSCOPE® X-RAY XDL®-B spectrometers.
The FISCHERSCOPE®-X-RAY XDL® instruments are universally applicable energy-dispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL® model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and pc-boards as well as for the solution analysis.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDL® x-ray spectrometers have an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort.
The instruments of the XDL® series are especially well suited for measurements in quality assurance, reception inspection and production monitoring.
Typical areas of application are:
•Measurement of electro-plated mass-produced parts
•Inspection of thin coatings, e.g., decorative chromium-plating
•Analysis of functional coatings in the electronics and semiconductor industries
•Automated measurements, e.g., on pc-boards
•Solution analysis in the electroplating
The new instruments are now available at all FISCHER offices.